SS-EN ISO 32543-1:2025
Current
Current
Non-destructive testing — Characteristics of focal spots in industrial X-ray systems — Part 1: Pinhole camera radiographic method (ISO 32543-1:2024, IDT)
Published date
10-01-2025
Publisher
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This document specifies a method for the measurement of effective focal spot dimensions above 0,1mm of X-ray systems up to and including 1000 kVX-ray voltage by means of the pinhole camera method with digital evaluation.
| Committee |
ISO/TC 135
|
| DocumentType |
Test Method
|
| PublisherName |
Standardiserings-Kommissionen I Sverige
|
| Status |
Current
|
| Standards | Relationship |
| EN ISO 32543-1:2025 | Identical |
| ISO 32543-1:2024 | Identical |
Summarise
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