UNE-EN 15991:2011
Superseded
Superseded
Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV) (Endorsed by AENOR in March of 2011.)
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
03-01-2011
Publisher
Superseded date
01-01-2016
US$94.95
Excluding Tax where applicable
| DocumentType |
Standard
|
| Pages |
29
|
| PublisherName |
Asociación Española de Normalización
|
| Status |
Superseded
|
| Standards | Relationship |
| BS EN 15991:2011 | Equivalent |
| I.S. EN 15991:2011 | Equivalent |
| DIN EN 15991:2011-04 | Equivalent |
| EN 15991:2011 | Identical |
Summarise
US$94.95
Excluding Tax where applicable
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