UNE-EN 15991:2015
Superseded
Superseded
View Superseded by
Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV) (Endorsed by AENOR in January of 2016.)
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-01-2016
Publisher
Superseded date
11-01-2025
Superseded by
US$94.57
Excluding Tax where applicable
| Committee |
CTN 61
|
| DocumentType |
Standard
|
| Pages |
27
|
| PublisherName |
Asociación Española de Normalización
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| BS EN 15991:2015 | Equivalent |
| I.S. EN 15991:2015 | Equivalent |
| EN 15991:2015 | Identical |
Summarise
US$94.57
Excluding Tax where applicable
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