UNE-EN 60749-20-1:2009
Current
Current
Semiconductor devices - Mechanical and climatic test methods -- Part 20-1: Handling, packing, labelling and shipping of surface mount devices sensitive to the combined effect of moisture and soldering heat (Endorsed by AENOR in September of 2009.)
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
09-01-2009
Publisher
US$147.68
Excluding Tax where applicable
| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| Pages |
35
|
| ProductNote |
THIS STANDARD ALSO REFERS TO IPC/JEDEC J-STD-033
|
| PublisherName |
Asociación Española de Normalización
|
| Status |
Current
|
| Standards | Relationship |
| I.S. EN 60749-20-1:2009 | Equivalent |
| DIN EN 60749-20-1:2009-10 | Equivalent |
| BS EN 60749-20-1:2009 | Equivalent |
| IEC 60749-20-1:2009 | Identical |
| BS 215-2:1970 | Identical |
| EN 60749-20-1:2009 | Identical |
Summarise
US$147.68
Excluding Tax where applicable
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