UNE-EN 60749-38:2008
Current
Current
Semiconductor devices- Mechanical and climatic test methods- Part 38: Soft error test method for semiconductor devices with memory (Endorsed by AENOR in September of 2008.)
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
09-01-2008
Publisher
US$74.70
Excluding Tax where applicable
Summarise this standard
AI-generated summary
| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| Pages |
16
|
| PublisherName |
Asociación Española de Normalización
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60749-38:2008 | Identical |
| EN 60749-38:2008 | Identical |
| DIN EN 60749-38:2008-10 | Equivalent |
| I.S. EN 60749-38:2008 | Equivalent |
| BS EN 60749-38:2008 | Equivalent |
US$74.70
Excluding Tax where applicable
Please Login or Create an Account so you can add users to your Multi user PDF Later.
Important note : All end users must be registered with an Account prior to user licenses being assigned.
Users cannot be edited or removed once added to your Multi user PDF.