UNE-EN 62047-12:2011
Current
Current
Semiconductor devices - Micro-electromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures (Endorsed by AENOR in February of 2012.)
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
02-01-2012
Publisher
US$99.75
Excluding Tax where applicable
| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| Pages |
33
|
| PublisherName |
Asociación Española de Normalización
|
| Status |
Current
|
| Standards | Relationship |
| BS EN 62047-12:2011 | Equivalent |
| I.S. EN 62047-12:2011 | Equivalent |
| IEC 62047-12:2011 | Identical |
| EN 62047-12:2011 | Identical |
Summarise
US$99.75
Excluding Tax where applicable
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