UNE-EN 62047-18:2013
Current
Current
Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials (Endorsed by AENOR in November of 2013.)
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
11-01-2013
Publisher
US$76.43
Excluding Tax where applicable
| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| Pages |
17
|
| PublisherName |
Asociación Española de Normalización
|
| Status |
Current
|
| Standards | Relationship |
| IEC 62047-18:2013 | Identical |
| EN 62047-18:2013 | Identical |
| BS EN 62047-18:2013 | Equivalent |
| I.S. EN 62047-18:2013 | Equivalent |
Summarise
US$76.43
Excluding Tax where applicable
Please Login or Create an Account so you can add users to your Multi user PDF Later.
Important note : All end users must be registered with an Account prior to user licenses being assigned.
Users cannot be edited or removed once added to your Multi user PDF.