UNE-EN IEC 61189-2-805:2024
Current
Test methods for electrical materials, printed boards and other interconnection structures and assemblies - Part 2-805: X/Y CTE test for thin base materials by TMA (Endorsed by Asociación Española de Normalización in July of 2024.)
Hardcopy , PDF
English
07-01-2024
This part of IEC 61189 defines the method to be followed for the determination of the X/Y coefficient of thermal expansion of thin electrical insulating materials via the use of a thermomechanical analyser (TMA). This method is applicable to materials that are solid for the entire range of temperature used, and that retain sufficient rigidity over the temperature range so that so that irreversible indentation of the specimen by the sensing probe does not occur.
| Committee |
CTN 203/SC 91-119
|
| DocumentType |
Standard
|
| Pages |
18
|
| PublisherName |
Asociación Española de Normalización
|
| Status |
Current
|
| Standards | Relationship |
| I.S. EN IEC 61189-2-805:2024 | Equivalent |
| BS EN IEC 61189-2-805:2024 | Equivalent |
| EN IEC 61189-2-805:2024 | Identical |
| IEC 61189-2-805:2024 | Identical |
Please Login or Create an Account so you can add users to your Multi user PDF Later.
Important note : All end users must be registered with an Account prior to user licenses being assigned.
Users cannot be edited or removed once added to your Multi user PDF.