VDI/VDE 2655 Blatt 1.1:2005-04 (Draft)
Superseded
Superseded
View Superseded by
Optical measurement and microtopographies - Calibration of interference microscopes and depth measurement standards for roughness measurement
Available format(s)
Hardcopy , PDF
Language(s)
German - English
Published date
04-01-2005
Publisher
Superseded date
05-04-2023
Superseded by
US$263.52
Excluding Tax where applicable
| DocumentType |
Draft
|
| Pages |
0
|
| PublisherName |
Verlag des Vereins Deutscher Ingenieure
|
| Status |
Superseded
|
| SupersededBy |
Summarise
US$263.52
Excluding Tax where applicable
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