EN 60862-1:2015
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Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
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IEC 60191-6:2009
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Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages
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EN 61019-1 : 2005
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Surface acoustic wave (SAW) resonators - Part 1: Generic specification
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EN 60368-2-2:1999
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Piezoelectric filters - Part 2: Guide to the use of piezoelectric filters - Section 2: Piezoelectric ceramic filters
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EN ISO 1101:2017
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Geometrical product specifications (GPS) - Geometrical tolerancing - Tolerances of form, orientation, location and run-out (ISO 1101:2017)
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IEC 60122-3:2010
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Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
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EN 61240:2017
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Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
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ISO 1101:2017
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Geometrical product specifications (GPS) — Geometrical tolerancing — Tolerances of form, orientation, location and run-out
|
IEC 61019-1:2004
|
Surface acoustic wave (SAW) resonators - Part 1: Generic specification
|
IEC 60368-1:2000+AMD1:2004 CSV
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Piezoelectric filters of assessed quality - Part 1: Genericspecification
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EN 60368-3:2010
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Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections
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IEC 60862-1:2015
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Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
|
IEC 60368-3:2010
|
Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections
|
IEC 61240:2016
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Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
|
IEC 61019-2:2005
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Surface acoustic wave (SAW) resonators - Part 2: Guide to the use
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IEC 60122-2:1983
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Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection
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IEC 60862-2:2012
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Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use
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IEC 60862-3:2003
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Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines
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EN 60679-3:2013
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Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
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IEC 60368-2-2:1996
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Piezoelectric filters - Part 2: Guide to the use of piezoelectricfilters - Section 2: Piezoelectric ceramic filters
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EN 60862-3:2003
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Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines
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EN 60862-2:2012
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Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use
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IEC 60679-3:2012
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Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
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IEC 60679-2:1981
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Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators
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EN 60191-6:2009
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Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages
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IEC 60368-2-1:1988
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Piezoelectric filters - Part 2-1: Guide to the use of piezoelectric filters - Quartz crystal filters
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EN 60368-1:2000/A1:2004
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PIEZOELECTRIC FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
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IEC 60679-1:2017
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Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
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EN 60122-3:2010
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Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
|