BS QC 750000(1986) : 1986

National foreword
Committees responsible
1. Scope
2. General
2.1 Related documents
2.2 Recommended values of temperatures (preferred
      values)
2.3 Recommended values of voltages and currents
      (preferred values)
2.4 Terminal identification
2.5 Colour codes for type designation
2.5.1 For JEDEC type numbers
2.5.2 For PRO ELECTRON type numbers
2.5.3 Any other type numbers
3. Quality assessment procedures
3.1 Primary stage of manufacture
3.2 Structurally similar devices
3.2.1 Grouping for electrical tests
3.2.2 Grouping for dimensional, climatic and mechanical
      inspections or tests
3.2.3 Grouping for endurance tests
3.3 Inspection requirements for qualification approval
3.4 Quality conformance inspection
3.4.1 Division into groups and sub-groups
      Table I - Group A: Lot-by-lot
      Table II - Group B: Lot-by-lot
      Table III - Group C: Periodic
3.5 Group D tests
3.6 Screening
      Table IV - Screening
3.7 Sampling requirements
      Table V - Sampling requirements for Group A tests
      Table VI - Sampling requirements for Groups B and
      C tests, in which LTPD shall be used
4. Test and measurement procedures

Forms part of the IEC Quality Assessment System for electronic components. It refers to discrete semi conductor devices and specifies quality assessment, test and measurement procedures.