IEC 60747-11:1985
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
Semiconductor devices. Discrete devices. Part 11: Sectionalspecification for discrete devices
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01-01-1985
31-12-2021
FOREWORD
PREFACE
Clause
1 Scope
2 General
2.1 Related documents
2.2 Recommended values of temperatures (preferred
values)
2.3 Recommended values of voltages and currents
(preferred values)
2.4 Terminal identification
2.5 Colour codes for type designation
2.5.1 For JEDEC type numbers
2.5.2 For PRO ELECTRON type numbers
2.5.3 Any other type numbers
3 Quality assessment procedures
3.1 Primary stage of manufacture
3.2 Structurally similar devices
3.2.1 Grouping for electrical tests
3.2.2 Grouping for dimensional, climatic and
mechanical inspections or tests
3.2.3 Grouping for endurance tests
3.3 Inspection requirements for qualification approval
3.4 Quality conformance inspection
3.4.1 Division into groups and sub-groups
Table I - Group A: Lot by lot
Table II - Group B: Lot by lot
Table III - Group C: Periodic
3.5 Group D tests
3.6 Screening
Table IV - Screening
3.7 Sampling requirements
Table V - Sampling requirements for Group A tests
Table VI - Sampling requirements for Groups B and C
tests, in which LTPD shall be used
4 Test and measurement procedures
Applies to discrete semiconductor devices, excluding optoelectronicdevices. Should be read together with the generic specification towhich it refers: it gives details of the Quality AssessmentProcedures, the inspection requirements, screening sequences,sampling requirements, test and measurement procedures required forthe assessment of semiconductor devices.
| DevelopmentNote |
Also numbered as BS QC750100(1986) (08/2005) Stability Date: 2015. (10/2012)
|
| DocumentType |
Standard
|
| Pages |
55
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Withdrawn
|
| Standards | Relationship |
| PN 90/T-01204 : 1990 | Identical |
| DIN IEC 60747-11:1992-04 | Identical |
| NEN 10747-11 : 1986 AMD 2 1997 | Identical |
| UTEC 96 011 : 1989 | Identical |
| AS 2547.1.11-1986 | Identical |
| BS QC 750000(1986) : 1986 | Identical |
This standard has been withdrawn and is no longer current. No replacement edition is available.
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