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CEI EN 60191-6-3 : 2001

Current

Current

The latest, up-to-date edition.

MECHANICAL STANDARDIZATION OF SEMICONDUCTOR DEVICES - PART 6-3: GENERAL RULES FOR THE PREPARATION OF OUTLINE DRAWINGS OF SURFACE MOUNTED SEMICONDUCTOR DEVICE PACKAGES - MEASURING METHODS FOR PACKAGE DIMENSIONS OF QUAD FLAT PACKS (QFP)

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2001

Foreword
1 Scope
2 Normative references
3 Definitions
4 Measuring methods
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

Defines a method for quad flat packs (QFP) measuring dimensions which are classified into Form E.

Committee
CT 309
DevelopmentNote
Classificazione CEI 47-1003. (07/2015)
DocumentType
Standard
Pages
24
PublisherName
Comitato Elettrotecnico Italiano
Status
Current

Standards Relationship
EN 60191-6-3:2000 Identical
IEC 60191-6-3:2000 Identical

IEC 60191-6:2009 Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages

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