CEI EN 60749-13 : 2004
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 13: SALT ATMOSPHERE
Hardcopy , PDF
English
01-01-2004
Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) - Normative
references to international
publications with their
corresponding European
publications
Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion.
| Committee |
CT 309
|
| DevelopmentNote |
Classificazione CEI 47-23 (04/2004) Supersedes CEI EN 60749. (05/2008)
|
| DocumentType |
Standard
|
| Pages |
12
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| IEC 60749-13:2002 | Identical |
| EN 60749-13:2002 | Identical |
| IEC 60068-2-11:1981 | Basic environmental testing procedures - Part 2-11: Tests - Test Ka: Salt mist |
| EN 60068-2-11:1999 | Environmental testing - Part 2: Tests - Test Ka: Salt mist |
| IEC 60749-14:2003 | Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity) |
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