IEC 60749-14:2003
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)
Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users
English - French, Spanish, Castilian
07-08-2003
FOREWORD
1 Scope
2 Normative references
3 General
4 Test condition A - Tension
5 Test condition B - Bending stress
6 Test condition C - Lead fatigue
7 Test condition D - Lead torque
8 Test condition E - Stud torque
Provides various tests for determining the integrity between the lead/package interface and the lead itself when the lead(s) are bent due to faulty board assembly followed by rework of the part for re-assembly.Applicable to all through-hole devices and surface-mount devices requiring lead forming by the user.
| Committee |
TC 47
|
| DevelopmentNote |
Supersedes IEC PAS 62184. (08/2003) Supersedes IEC 60749. (03/2008) Stability Date: 2021. (11/2017)
|
| DocumentType |
Standard
|
| Pages |
27
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| PN EN 60749-14 : 2005 | Identical |
| BS EN 60749-14:2003 | Identical |
| CEI EN 60749-14 : 2004 | Identical |
| I.S. EN 60749-14:2003 | Identical |
| NF EN 60749-14 : 2004 | Identical |
| EN 60749-14:2003 | Identical |
| NEN EN IEC 60749-14 : 2003 | Identical |
| DIN EN 60749-14:2004-07 | Identical |
| BS EN 60068-2-13:1999 | Identical |
| UNE-EN 60749-14:2004 | Identical |
| CEI EN 60749-13 : 2004 | SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 13: SALT ATMOSPHERE |
| CEI EN 61747-10-1 : 2014 | LIQUID CRYSTAL DISPLAY DEVICES - PART 10-1: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - MECHANICAL |
| I.S. EN 60749-13:2002 | SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 13: SALT ATMOSPHERE |
| BS EN 62922:2017 | Organic light emitting diode (OLED) panels for general lighting. Performance requirements |
| I.S. EN 61747-10-1:2013 | LIQUID CRYSTAL DISPLAY DEVICES - PART 10-1: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - MECHANICAL (IEC 61747-10-1:2013 (EQV)) |
| EN 62922:2017 | Organic light emitting diode (OLED) panels for general lighting - Performance Requirements |
| 07/30162213 DC : 0 | BS EN 60747-15 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 15: ISOLATED POWER SEMICONDUCTOR DEVICES |
| BS EN 61747-10-1:2013 | Liquid crystal display devices Environmental, endurance and mechanical test methods. Mechanical |
| BS EN 60749-13:2002 | Semiconductor devices. Mechanical and climatic test methods Salt atmosphere |
| I.S. EN 62922:2017 | ORGANIC LIGHT EMITTING DIODE (OLED) PANELS FOR GENERAL LIGHTING - PERFORMANCE REQUIREMENTS |
| IEC 61747-10-1:2013 | Liquid crystal display devices - Part 10-1: Environmental, endurance and mechanical test methods - Mechanical |
| 13/30264591 DC : 0 | BS EN 60747-14-6 ED 1.0 - SEMICONDUCTOR DEVICES - PART 14-6: SEMICONDUCTOR SENSORS - HUMIDITY SENSOR |
| 13/30264600 DC : 0 | BS EN 60747-14-8 ED 1.0 - SEMICONDUCTOR DEVICES - PART 14-8: SEMICONDUCTOR SENSORS - CAPACITIVE DEGRADATION SENSOR OF LIQUID |
| IEC TS 62686-1:2015 | Process management for avionics - Electronic components for aerospace, defence and high performance (ADHP) applications - Part 1: General requirements for high reliability integrated circuits and discrete semiconductors |
| IEC 60749-13:2018 | Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere |
| IEC 61747-3-1:2015 | Liquid crystal display devices - Part 3-1: Liquid crystal display (LCD) cells - Blank detail specification |
| PD IEC/TS 62686-1:2015 | Process management for avionics. Electronic components for aerospace, defence and high performance (ADHP) applications General requirements for high reliability integrated circuits and discrete semiconductors |
| I.S. EN IEC 60749-13:2018 | SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 13: SALT ATMOSPHERE |
| EN IEC 60749-13:2018 | Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere |
| 13/30264596 DC : 0 | BS EN 60747-14-7 ED 1.0 - SEMICONDUCTOR DEVICES - PART 14-7: SEMICONDUCTOR SENSORS - FLOW METER |
| IEC 60747-5-6:2016 | Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes |
| IEC 62922:2016 | Organic light emitting diode (OLED) panels for general lighting - Performance requirements |
| EN 61747-10-1:2013 | Liquid crystal display devices - Part 10-1: Environmental, endurance and mechanical test methods – Mechanical |
| EN 60749-13:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere |
| IEC 60749-8:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing |
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