CEI EN 61967-8 : 2012
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS - PART 8: MEASUREMENT OF RADIATED EMISSIONS - IC STRIPLINE METHOD
Hardcopy , PDF
English
01-01-2012
20-12-2023
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 General
5 Test conditions
6 Test equipment
7 Test set-up
8 Test procedure
9 Test report
10 IC Emissions reference levels
Annex A (normative) - IC stripline description
Annex B (informative) - Specification of emission levels
Bibliography
Annex ZA (normative) - Normative references to
international publications with their corresponding
European publications
Describes procedure of this part of IEC 61967 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline in the frequency range of 150 kHz up to 3 GHz.
| Committee |
CT 309
|
| DocumentType |
Standard
|
| Pages |
24
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| EN 61967-8:2011 | Identical |
| IEC 61967-8:2011 | Identical |
| IEC 61967-2:2005 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method |
| IEC 60050-131:2002 | International Electrotechnical Vocabulary (IEV) - Part 131: Circuit theory |
| IEC 61967-1:2002 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions |
| EN 61967-2:2005 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method |
| EN 61967-1:2002 | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions |
| IEC 61000-4-20:2010 | Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides |
| EN 61000-4-20:2010 | Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides |
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