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CEI EN IEC 62506:2024

Current

Current

The latest, up-to-date edition.

Methods for product accelerated testing

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-03-2024

$435.96
Including GST where applicable

This document provides guidance on the application of various accelerated test techniques for measurement or improvement of item reliability.

Committee
CT 56
DocumentType
Standard
ISBN
978-2-8322-7727-0
Pages
100
PublisherName
Comitato Elettrotecnico Italiano
Status
Current
Supersedes

Standards Relationship
IEC 62506:2023 Identical
EN IEC 62506:2023 Identical

IEC 61163-2:2020 Reliability stress screening - Part 2: Components
IEC 60300-3-4:2022 Dependability management - Part 3-4: Application guide - Specification of dependability requirements
JEDEC JESD22-A110E : 2015 HIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)
IEC 62740:2015 Root cause analysis (RCA)
IEC 60812:2018 Failure modes and effects analysis (FMEA and FMECA)
IEC 61014:2003 Programmes for reliability growth
JEDEC JESD85A:2021 METHODS FOR CALCULATING FAILURE RATES IN UNITS OF FITS
JEDEC JESD47L:2022 Stress-Test-Driven Qualification of Integrated Circuits

$435.96
Including GST where applicable