DIN EN 60749-29:2012-01
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 29: LATCH-UP TEST (IEC 60749-29:2011)
Hardcopy , PDF
German
01-01-2012
1 Scope and object
2 Terms and definitions
3 Apparatus and material
3.1 Latch-up tester
3.2 Automated test equipment (ATE)
3.3 Heat source
4 Procedure
4.1 General latch-up test procedure
4.2 Detailed latch-up test procedure
5 Failure criteria
6 Summary
Figure 1 - V[supply] qualification circuit
Figure 2 - Trigger source qualification circuit
Figure 3 - Latch-up test flow
Figure 4 - Test waveform for positive I-test
Figure 5 - Test waveform for negative I-test
Figure 6 - Test waveform for V[supply] overvoltage
Figure 7 - Equivalent circuit for positive input/output I-test
latch-up testing
Figure 8 - Equivalent circuit for negative input/output I-test
latch-up testing
Figure 9 - Equivalent circuit for V[supply] overvoltage test
latch-up testing
Table 1 - Test matrix
Table 2 - Timing specifications for I-test and V[supply]
overvoltage test
| DocumentType |
Standard
|
| Pages |
27
|
| PublisherName |
German Institute for Standardisation (Deutsches Institut für Normung)
|
| Status |
Current
|
| Standards | Relationship |
| BS EN 60749-29:2011 | Identical |
| NF EN 60749-29 : 2012 | Identical |
| NBN EN 60749-29 : 2011 | Identical |
| EN 60749-29:2011 | Identical |
| I.S. EN 60749-29:2011 | Identical |
| IEC 60749-29:2011 | Identical |
| UNE-EN 60749-29:2004 | Identical |
| DIN 14700-1:2016-08 | Firefighting and fire protection - CAN interface for components in emergency vehicles - Part 1: General requirements |
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