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DS EN 60749-5 : 2017

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 5: STEADY-STATE TEMPERATURE HUMIDITY BIAS LIFE TEST

Published date

12-01-2013

Superseded date

06-02-2024

Superseded by

DS/EN IEC 60749-5:2024

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Gives a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

Committee
DS/V-001
DevelopmentNote
2003 Edition is still active and will be withdrawn on 15/05/2020. (07/2017)
DocumentType
Standard
PublisherName
Danish Standards
Status
Superseded
SupersededBy

Standards Relationship
IEC 60749-5:2017 Identical
EN 60749-5:2017 Identical

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