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IEC 60749-5:2017

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

Available format(s)

Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English - French, English

Published date

10-04-2017

Superseded date

19-12-2023

$85.36
Including GST where applicable
Summarise this standard

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 General
5 Equipment
6 Test conditions
7 Procedures
8 Failure criteria
9 Safety
10 Summary

IEC 60749-5:2017 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous edition:
a) correction of an error in an equation;
b) inclusion of notes for guidance;
c) clarification of the applicability of test conditions.

Committee
TC 47
DevelopmentNote
Supersedes IEC PAS 62161 (04/2003) Supersedes IEC 60749. (03/2008) Stability Date: 2023. (04/2017)
DocumentType
Standard
ISBN
978-2-8322-7379-1
Pages
18
PublisherName
International Electrotechnical Committee
Status
Superseded
SupersededBy
Supersedes

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A newer version of this standard is available.

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$85.36
Including GST where applicable