I.S. EN 60749-32:2003
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 32: FLAMMABILITY OF PLASTIC-ENCAPSULATED DEVICES (EXTERNALLY INDUCED)
Hardcopy , PDF
English
01-01-2003
For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
FOREWORD
INTRODUCTION
1 Scope and object
2 Normative references
3 Test procedure
Annex ZA (normative) - Normative references to international
publications with their corresponding European
publications
Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to external heating.
| DevelopmentNote |
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
|
| DocumentType |
Standard
|
| Pages |
25
|
| PublisherName |
National Standards Authority of Ireland
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60749-32:2002+AMD1:2010 CSV | Identical |
| DIN EN 60749-32:2011-01 | Identical |
| NF EN 60749-32 : 2003 AMD 1 2011 | Identical |
| BS EN 60749-32 : 2003 | Identical |
| NBN EN 60749-32 : 2004 AMD 1 2010 | Identical |
| EN 60749-32:2003 | Equivalent |
| UNE-EN 60749-32:2004 | Identical |
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