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IEC 60749-3:2017

Current

Current

The latest, up-to-date edition.

Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination

Available format(s)

Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English - French, English

Published date

03-03-2017

$85.36
Including GST where applicable
Summarise this standard

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
6 Failure criteria
7 Summary
Annex A (informative) - External visual report
        form/checklist (example only - not a
        mandatory template)
Bibliography

IEC 60749-3:2017 is to verify that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document. External visual inspection is a non-destructive test and applicable for all package types. The test is useful for qualification, process monitor, or lot acceptance.
This edition includes the following significant technical changes with respect to the previous edition:
a) reference to the need for ESD protection;
b) inclusion of information on the phenomenon of tin whiskers;
c) inclusion of an optional report form/checklist.

Committee
TC 47
DevelopmentNote
Supersedes IEC PAS 62163 (08/2002) Supersedes IEC 60749. (03/2008) Stability Date: 2022. (03/2017)
DocumentType
Standard
ISBN
978-2-8322-7318-0
Pages
21
PublisherName
International Electrotechnical Committee
Status
Current
Supersedes

$85.36
Including GST where applicable