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IEC 60749-30:2005+AMD1:2011 CSV

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

Available format(s)

Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English - French

Published date

10-08-2011

Superseded date

12-09-2022

$362.78
Including GST where applicable
Summarise this standard

FOREWORD
1 Scope
2 Normative references
3 General description
4 Test apparatus and materials
5 Procedure
6 Summary

IEC 60749-30:2005+A1:2011 establishes a standard procedure for determining the preconditioning of non-hermetic surface mount devices (SMDs) prior to reliability testing. The test method defines the preconditioning flow for non-hermetic solid-state SMDs representative of a typical industry multiple solder reflow operation. These SMDs should be subjected to the appropriate preconditioning sequence described in this standard prior to being submitted to specific in-house reliability testing (qualification and/or reliability monitoring) in order to evaluate long term reliability (impacted by soldering stress). This consolidated version consists of the first edition (2005) and its amendment 1 (2011). Therefore, no need to order amendment in addition to this publication.

Committee
TC 47
DevelopmentNote
Supersedes IEC PAS 62182. (01/2005) Stability Date: 2015. (10/2012)
DocumentType
Standard
Pages
28
PublisherName
International Electrotechnical Committee
Status
Superseded
SupersededBy
Supersedes

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A newer version of this standard is available.

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$362.78
Including GST where applicable