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PN EN 60749-30 : 2007 AMD 1 2011

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 30: PRECONDITIONING OF NON-HERMETIC SURFACE MOUNT DEVICES PRIOR TO RELIABILITY TESTING

Published date

12-01-2013

Superseded date

24-05-2021

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Defines a standard procedure for determining the preconditioning of non-hermetic surface mount devices (SMDs) prior to reliability testing.

Committee
TC 60
DevelopmentNote
AMD 1 2011 is only available in English. (12/2011)
DocumentType
Standard
PublisherName
Polish Committee for Standardization
Status
Superseded

Standards Relationship
IEC 60749-30:2005+AMD1:2011 CSV Identical
EN 60749-30 : 2005 AMD 1 2011 Identical

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