IEEE 1804-2017
Current
The latest, up-to-date edition.
IEEE Standard for Fault Accounting and Coverage Reporting(FACR) for Digital Modules
Hardcopy , PDF
English
28-02-2018
1. Overview
2. Definitions, acronyms, and abbreviations
3. Fault classification and test coverage reporting
4. Fault modeling
5. Fault accounting methods and rules
6. Summary
Annex A (informative) - Bibliography
This standard formalizes aspects of the stuck-at fault model as they are relevant to the generation of test patterns for digital circuits.
| Committee |
Test Technology
|
| DocumentType |
Standard
|
| ISBN |
978-1-5044-4317-3
|
| Pages |
29
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Current
|
| IEEE 1364-2005 | IEEE Standard for Verilog Hardware Description Language |
| IEEE 1500:2007 | TESTABILITY METHOD FOR EMBEDDED CORE-BASED INTEGRATED CIRCUITS |
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