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ISO 16243:2011

Current

Current

The latest, up-to-date edition.

Surface chemical analysis — Recording and reporting data in X-ray photoelectron spectroscopy (XPS)

Available format(s)

Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English, French

Published date

25-11-2011

$142.98
Including GST where applicable

ISO 16243:2011 specifies the minimum level of information to be reported by the analyst following the analysis of a test specimen using X‑ray photoelectron spectroscopy (XPS). It includes information that is to be recorded on or in the analytical record.

Committee
ISO/TC 201/SC 2
DevelopmentNote
Supersedes ISO/DIS 16243. (11/2011)
DocumentType
Standard
Pages
9
PublisherName
International Organization for Standardization
Status
Current

Standards Relationship
NEN ISO 16243 : 2011 Identical
BS ISO 16243:2011 Identical
NF ISO 16243 : 2012 Identical

ISO 13424:2013 Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
BS ISO 13424:2013 Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis

ISO 15472:2010 Surface chemical analysis — X-ray photoelectron spectrometers — Calibration of energy scales
ISO 18115-1:2013 Surface chemical analysis — Vocabulary — Part 1: General terms and terms used in spectroscopy
ISO 18117:2009 Surface chemical analysis — Handling of specimens prior to analysis
ISO/TR 15969:2001 Surface chemical analysis — Depth profiling — Measurement of sputtered depth
ISO 18116:2005 Surface chemical analysis — Guidelines for preparation and mounting of specimens for analysis
ISO 20903:2011 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Methods used to determine peak intensities and information required when reporting results

$142.98
Including GST where applicable