Name: NEN ISO 16243 : 2011 - SURFACE CHEMICAL ANALYSIS - RECORDING AND REPORTING DATA IN X-RAY PHOTOELECTRON SPECTROSCOPY (XPS)
Brand: Netherlands Standards

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SURFACE CHEMICAL ANALYSIS - RECORDING AND REPORTING DATA IN X-RAY PHOTOELECTRON SPECTROSCOPY (XPS)

Published date

12-01-2013

Publisher

Netherlands Standards

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Defines the minimum level of information to be reported by the analyst following the analysis of a test specimen using X-ray photoelectron spectroscopy (XPS). Also provides information that is to be recorded on or in the analytical record.