NBN EN 60749-3 : 2003
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 3: EXTERNAL VISUAL EXAMINATION
Published date
12-01-2013
Publisher
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Foreword
1 Scope
2 Test apparatus
3 Procedure
4 Failure criteria
5 Summary
Verifies that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document.
| DocumentType |
Standard
|
| PublisherName |
Belgian Standards
|
| Status |
Current
|
| Standards | Relationship |
| DIN EN 60749-3:2003-04 | Identical |
| I.S. EN 60749-3:2017 | Identical |
| NF EN 60749-3 : 2002 | Identical |
| BS EN 60749-3:2017 | Identical |
| UNE-EN 60749-3:2003 | Identical |
| EN 60749-3:2017 | Identical |
Summarise
Sorry this product is not available in your region.