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05/30128292 DC : DRAFT JAN 2005

Superseded

Superseded

View Superseded by

IEC 60749-27 ED.2 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 27: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING MACHINE MODEL (MM)

Published date

11-23-2012

Superseded date

09-29-2006

Superseded by

BS EN 60749-27 : 2006

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Summarise this standard

Committee
EPL/47
DocumentType
Draft
PublisherName
British Standards Institution
Status
Superseded
SupersededBy

Sorry this product is not available in your region.