05/30128292 DC : DRAFT JAN 2005
Superseded
Superseded
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IEC 60749-27 ED.2 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 27: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING MACHINE MODEL (MM)
Published date
11-23-2012
Publisher
Superseded date
09-29-2006
Superseded by
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Summarise this standard
AI-generated summary
| Committee |
EPL/47
|
| DocumentType |
Draft
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
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