SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 27: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - MACHINE MODEL (MM)

Amended by

BS EN 60749-27:2006+A1:2012

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2006

Publisher

British Standards Institution

1 Scope
2 Normative references
3 Terms and definitions
4 Equipment
5 MM current waveform requirements
6 Device specific evaluation considerations
7 Classification procedure
8 Failure criteria
9 Classification criteria
10 Summary
Annex ZA (normative) - Normative references to international
publications with their corresponding European
publications

Describes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD).

Committee	EPL/47
DevelopmentNote	Supersedes BS EN 60749. (09/2006) Supersedes 05/30128292 DC (10/2006) 2006 Edition Re-Issued in January 2013 & incorporates AMD 1 2012 Supersedes 11/30252690 DC. (02/2013)
DocumentType	Standard
Pages	16
PublisherName	British Standards Institution
Status	Current
Supersedes	05/30128292 DC : DRAFT JAN 2005 BS EN 60749:1999 11/30252690 DC : 0

Standards	Relationship
I.S. EN 60749-27:2006	Identical
NF EN 60749-27 : 2006 AMD 1 2013	Identical
EN 60749-27:2006/A1:2012	Identical
NBN EN 60749-27 : 2007 AMD 1 2012	Identical
IEC 60749-27:2006+AMD1:2012 CSV	Identical
DIN EN 60749-27:2013-04	Identical

EN 61340-3-2:2007	Electrostatics - Part 3-2: Methods for simulation of electrostatic effects - Machine model (MM) electrostatic discharge test waveforms
IEC 60749-26:2013	Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
IEC 61340-3-2:2006	Electrostatics - Part 3-2: Methods for simulation of electrostatic effects - Machine model (MM) electrostatic discharge test waveforms
EN 60749-26:2014	Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

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BS EN 60749-27 : 2006

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 27: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - MACHINE MODEL (MM)

Table of Contents

Abstract

General Product Information

International Equivalents

Standards Referencing This Book

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