DIN EN 60749-27:2013-04
Current
Current
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 27: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - MACHINE MODEL (MM) (IEC 60749-27:2006+A1:2012)
Available format(s)
Hardcopy , PDF
Language(s)
German
Published date
01-01-2013
US$117.96
Excluding Tax where applicable
| DocumentType |
Standard
|
| Pages |
15
|
| PublisherName |
German Institute for Standardisation (Deutsches Institut für Normung)
|
| Status |
Current
|
| Standards | Relationship |
| I.S. EN 60749-27:2006 | Identical |
| NF EN 60749-27 : 2006 AMD 1 2013 | Identical |
| BS EN 60749-27 : 2006 | Identical |
| EN 60749-27:2006/A1:2012 | Identical |
| NBN EN 60749-27 : 2007 AMD 1 2012 | Identical |
| IEC 60749-27:2006+AMD1:2012 CSV | Identical |
Summarise
US$117.96
Excluding Tax where applicable
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