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Superseded
View Superseded by
BS EN 60749-42 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 42: TEMPERATURE HUMIDITY STORAGE
Hardcopy , PDF
English
10-31-2014
1 Scope
2 Normative references
3 Test equipment
4 Procedure
5 Failure Criteria
6 Information to be given in applicable
procurement document
BS EN 60749-42.
| Committee |
EPL/47
|
| DocumentType |
Draft
|
| Pages |
10
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
| IEC 60749-20:2008 | Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat |
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