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13/30203227 DC : 0

Superseded

Superseded

View Superseded by

BS ISO 13083 - SURFACE CHEMICAL ANALYSIS - SCANNING PROBE MICROSCOPY - STANDARDS ON THE DEFINITION AND CALIBRATION OF SPATIAL RESOLUTION OF SCANNING SPREADING RESISTANCE MICROSCOPY AND SCANNING CAPACITANCE MICROSCOPY

Available format(s)

Hardcopy , PDF

Language(s)

English

Superseded date

08-31-2015

Superseded by

BS ISO 13083:2015

US$29.42
Excluding Tax where applicable

Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Symbols and abbreviated terms
5 General information
6 Measurement of lateral resolution of SCM with the sharp-edge
  method
7 Measurement of lateral resolution of SSRM with the sharp-edge
  method
Annex A (informative) - An example of the measurement of SCM
        resolution
Annex B (informative) - An example of the measurement of SSRM
        resolution
Bibliography

BS ISO 13083

Committee
CII/60
DocumentType
Draft
Pages
20
PublisherName
British Standards Institution
Status
Superseded
SupersededBy

ISO 18115:2001 Surface chemical analysis — Vocabulary
ISO 18516:2006 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Determination of lateral resolution

US$29.42
Excluding Tax where applicable