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Superseded
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BS EN 60749-4 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 4: DAMP HEAT, STEADY STATE, HIGHLY ACCELERATED STRESS TEST (HAST)
Hardcopy , PDF
English
11-30-2017
FOREWORD
1 Scope
2 Normative references
3 HAST test - General remarks
4 Test apparatus
5 Test conditions
6 Procedure
7 Failure criteria
8 Safety
9 Summary
BS EN 60749-4.
| Committee |
EPL/47
|
| DocumentType |
Draft
|
| Pages |
11
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
| IEC 60749-5:2017 | Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test |
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