IEC 60749-5:2017
Superseded
View Superseded by
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Hardcopy , PDF
English - French, English
04-10-2017
12-19-2023
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 General
5 Equipment
6 Test conditions
7 Procedures
8 Failure criteria
9 Safety
10 Summary
IEC 60749-5:2017 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous edition:
a) correction of an error in an equation;
b) inclusion of notes for guidance;
c) clarification of the applicability of test conditions.
| Committee |
TC 47
|
| DevelopmentNote |
Supersedes IEC PAS 62161 (04/2003) Supersedes IEC 60749. (03/2008) Stability Date: 2023. (04/2017)
|
| DocumentType |
Standard
|
| ISBN |
978-2-8322-7379-1
|
| Pages |
18
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| BS EN 60749-5:2017 | Identical |
| EN 60749-5:2017 | Identical |
| CEI EN 60749-5 : 2005 | Identical |
| DIN EN 60749-5:2003-09 | Identical |
| NEN EN IEC 60749-5 : 2017 | Identical |
| I.S. EN 60749-5:2017 | Equivalent |
| CEI EN 60749-5:2017-11 | Identical |
| DS EN 60749-5 : 2017 | Identical |
| NF EN 60749-5 : 2003 | Identical |
| UNE-EN 60749-5:2017 | Identical |
| PN EN 60749-5 : 2017 | Identical |
| UNE-EN 60749-5:2003 | Identical |
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