IEC PAS 62161:2000
Superseded
View Superseded by
Steady state temperature humidity bias life test
Hardcopy , PDF
English
08-22-2000
01-17-2003
FOREWORD
1 Purpose
2 Apparatus
3 Test conditions
4 Procedures
5 Failure criteria
6 Safety
7 Summary
Aims at evaluating the reliability of nonhermetic packaged solid-state devices in humid environments. Employs conditions of temperature, humidity, and bias which accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.
| DocumentType |
Miscellaneous Product
|
| Pages |
6
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
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