PN EN 60749-5 : 2017
Superseded
Superseded
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 5: STEADY-STATE TEMPERATURE HUMIDITY BIAS LIFE TEST
Published date
01-12-2013
Publisher
Superseded date
09-23-2024
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Summarise this standard
AI-generated summary
| Committee |
TC 60
|
| DocumentType |
Standard
|
| PublisherName |
Polish Committee for Standardization
|
| Status |
Superseded
|
| Standards | Relationship |
| IEC 60749-5:2017 | Identical |
| EN 60749-5:2017 | Identical |
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