EN 60749-5:2017
Current
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
07-07-2017
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 General
5 Equipment
6 Test conditions
7 Procedures
8 Failure criteria
9 Safety
10 Summary
Annex ZA (normative) - Normative references to international
publications with their corresponding European
publications
IEC 60749-5:2017(E) provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision.This edition includes the following significant technical changes with respect to the previous edition:a) correction of an error in an equation;b) inclusion of notes for guidance;c) clarification of the applicability of test conditions.
| Committee |
CLC/TC 47X
|
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60749-5:2017 | Identical |
| NF EN 60749-5 : 2003 | Identical |
| NBN EN 60749-5 : 2004 | Identical |
| NEN EN IEC 60749-5 : 2017 | Identical |
| I.S. EN 60749-5:2017 | Identical |
| NF EN 60749-5:2017 | Identical |
| BS EN 60749-5:2017 | Identical |
| CEI EN 60749-5 : 2005 | Identical |
| DIN EN 60749-5:2003-09 | Identical |
| CEI EN 60749-5:2017-11 | Identical |
| DS EN 60749-5 : 2017 | Identical |
| UNE-EN 60749-5:2017 | Identical |
| PN EN 60749-5 : 2017 | Identical |
| UNE-EN 60749-5:2003 | Identical |