NF EN 60749-5:2017
Current
Current
Semiconductor devices - Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test
Published date
07-01-2017
Publisher
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Summarise this standard
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This part of IEC 60749 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
| Committee |
TC 47
|
| DocumentType |
Test Method
|
| PublisherName |
Association Francaise de Normalisation
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| EN 60749-5:2017 | Identical |
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