UNE-EN 60749-5:2003
Superseded
Superseded
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Available format(s)
Hardcopy , PDF
Language(s)
Spanish, Castilian, English
Published date
11-21-2003
Publisher
Superseded date
02-08-2020
US$66.07
Excluding Tax where applicable
| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| Pages |
12
|
| PublisherName |
Asociación Española de Normalización
|
| Status |
Superseded
|
| Standards | Relationship |
| IEC 60749-5:2017 | Identical |
| NF EN 60749-5 : 2003 | Identical |
| EN 60749-5:2003 | Identical |
| NBN EN 60749-5 : 2004 | Identical |
| BS EN 60749-5:2017 | Identical |
| EN 60749-5:2017 | Identical |
| I.S. EN 60749-5:2017 | Identical |
| IEC 60749-5:2003 | Identical |
| DIN EN 60749-5:2003-09 | Identical |
| BS EN 60749-5:2003 | Equivalent |
| I.S. EN 60749-5:2003 | Equivalent |
Summarise
US$66.07
Excluding Tax where applicable
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