BS EN 60749-5:2003
Superseded
View Superseded by
Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test
Hardcopy , PDF
English
06-18-2003
07-20-2017
| Committee |
EPL/47
|
| DocumentType |
Standard
|
| Pages |
12
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
| Standards | Relationship |
| IEC 60749-5:2003 | Identical |
| DIN EN 60749-5:2003-09 | Equivalent |
| I.S. EN 60749-5:2003 | Equivalent |
| EN 60749-5:2003 | Equivalent |
| UNE-EN 60749-5:2003 | Equivalent |
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