EN 60749-5:2003
Withdrawn
Withdrawn
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Published date
03-13-2003
Withdrawn date
03-01-2006
Sorry this product is not available in your region.
Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Withdrawn
|
| Standards | Relationship |
| I.S. EN 60749-5:2003 | Equivalent |
| DIN EN 60749-5:2003-09 | Equivalent |
| BS EN 60749-5:2003 | Equivalent |
| UNE-EN 60749-5:2003 | Identical |
Summarise
Sorry this product is not available in your region.