16/30344800 DC : 0
Superseded
View Superseded by
BS EN 60749-3 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 3: EXTERNAL VISUAL EXAMINATION
Hardcopy , PDF
English
11-30-2017
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Failure criteria
6 Summary
Annex A (informative) - External Visual report
form/checklist (example only - not a
mandatory template)
BS EN 60749-3.
| Committee |
EPL/47
|
| DocumentType |
Draft
|
| Pages |
12
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
| IEC 61340-5-1:2016 | Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements |
| IEC 62483:2013 | Environmental acceptance requirements for tin whisker susceptibility of tin and tin alloy surface finishes on semiconductor devices |
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