BS EN 60749-3:2002
Superseded
View Superseded by
Semiconductor devices. Mechanical and climatic test methods External visual examination
Hardcopy , PDF
English
09-17-2002
01-01-2017
| Committee |
EPL/47
|
| DocumentType |
Standard
|
| Pages |
8
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
Aims at verifying that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document. External visual inspection is a non-destructive test and applicable for all package types. The contents of the corrigendum of August 2003 have been included in this copy.
| Standards | Relationship |
| EN 60749-3:2002 | Identical |
| IEC 60749-3:2002 | Identical |
| I.S. EN 60749-3:2002 | Equivalent |
| I.S. EN 60749-3:2017 | Identical |
| NF EN 60749-3 : 2002 | Identical |
| EN 60749-3:2002 | Equivalent |
| UNE-EN 60749-3:2003 | Identical |
| IEC 60749-3:2017 | Identical |
| EN 60749-3:2017 | Identical |
| DIN EN 60749-3:2003-04 | Identical |
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