EN 60749-3:2002
Withdrawn
Withdrawn
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
Published date
08-13-2002
Withdrawn date
07-01-2005
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Aims at verifying that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document. External visual inspection is a non-destructive test and applicable for all package types.
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Withdrawn
|
| Standards | Relationship |
| I.S. EN 60749-3:2002 | Equivalent |
| BS EN 60749-3:2002 | Equivalent |
| BS EN 60749-3:2002 | Identical |
| UNE-EN 60749-3:2003 | Identical |
Summarise
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