AS C366.5-1978
Superseded
View Superseded by
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods Mechanical and climatic test methods
PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users
English
01-01-1978
02-22-2023
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This part of AS C366 lists test methods applicable to semiconductor devices and integrated circuits, from which a selectrion may be made, taking into account, wherever possible, AS 1099.
| Committee |
TE-012
|
| DocumentType |
Standard
|
| ISBN |
0 7262 1542 2
|
| Pages |
8
|
| PublisherName |
Standards Australia
|
| Status |
Superseded
|
| SupersededBy |
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