AS 2547.3.1-1986
Withdrawn
Withdrawn
Semiconductor devices Mechanical and climatic test methods
Available format(s)
Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users
Language(s)
English
Published date
01-01-1986
Publisher
Withdrawn date
06-30-2017
US$65.78
Excluding Tax where applicable
| Committee |
TE-012
|
| DocumentType |
Standard
|
| ISBN |
0 7262 4251 9
|
| Pages |
25
|
| PublisherName |
Standards Australia
|
| Status |
Withdrawn
|
| Supersedes |
| Standards | Relationship |
| IEC 60749:1984 | Identical |
Summarise
US$65.78
Excluding Tax where applicable
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