IEC 60749:1984
Superseded
View Superseded by
Semiconductor devices - Mechanical and climatic test methods.
Hardcopy , PDF
12-30-1984
03-09-2020
Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made.Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.
| Committee |
TC 47
|
| DocumentType |
Standard
|
| Pages |
123
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| AS 2547.3.1-1986 | Identical |
| BS 6493-3:1985 | Identical |
| UNE 20699:1992 | Identical |
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