IEC 60749:1996
Superseded
Semiconductor devices - Mechanical and climatic test methods
Hardcopy , PDF
10-28-1996
03-09-2020
Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.
| Committee |
TC 47
|
| DocumentType |
Standard
|
| Pages |
179
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| Supersedes |
| Standards | Relationship |
| CEI EN 60749:2000-10 | Identical |
| UNE-EN 60749:2000 | Identical |
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