UNE-EN 60749:2000
Superseded
Superseded
Semiconductor devices - Mechanical and climatic test methods
Available format(s)
Hardcopy , PDF
Language(s)
Spanish, Castilian, English
Published date
11-15-2000
Publisher
Superseded date
10-01-2005
US$125.34
Excluding Tax where applicable
Summarise this standard
AI-generated summary
| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| Pages |
52
|
| PublisherName |
Asociación Española de Normalización
|
| Status |
Superseded
|
| Standards | Relationship |
| EN 60749:1999 | Identical |
| IEC 60749:1996 | Identical |
US$125.34
Excluding Tax where applicable
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